发明名称 METHOD OF MANUFACTURING LAMINATION STRUCTURE HAVING OXIDE SEMICONDUCTOR THIN FILM LAYER
摘要 PROBLEM TO BE SOLVED: To provide an oxide thin film having a good quality by controlling a direction of crystal arrangement of the oxide thin film.SOLUTION: A method of manufacturing a lamination structure consisting of an oxide layer and an insulating layer, includes the following steps of: (1) providing the insulating layer; (2) depositing an oxide thin film on the insulating layer so that Rrms (root-mean-square-roughness) at 20×20 μmis in a range of 1.0-5.3 Å; and (3) performing heat treatment of the thin film at 150-500°C to obtain the oxide layer. In the case where a substrate is transported sequentially to positions opposed to three or more targets juxtaposed at a predetermined interval in a vacuum chamber, and a negative potential and a positive potential are alternately applied from an AC power supply to each of the targets, the step (2) is performed using a sputtering method by generating plasma on the target while switching a target to which the potential should be applied between two or more branched and connected targets, with respect to at least one output from the AC power supply.
申请公布号 JP2013145885(A) 申请公布日期 2013.07.25
申请号 JP20130011206 申请日期 2013.01.24
申请人 IDEMITSU KOSAN CO LTD 发明人 EBATA KAZUAKI;TOMAI SHIGEKAZU;TSURUMA YUKI;MATSUZAKI SHIGEO;YANO KIMINORI
分类号 H01L21/363;C23C14/34;C23C14/58;H01L21/20;H01L21/336;H01L29/786 主分类号 H01L21/363
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