发明名称 CONTINUOUS BOARD THICKNESS MEASURING INSTRUMENT, CROWN INSPECTION DEVICE AND INSPECTION METHOD THEREOF, RIPPLE INSPECTION DEVICE AND INSPECTION METHOD THEREOF, AND CROWN CONTROL DEVICE AND CONTROL METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a non-contact type continuous board thickness measuring instrument capable of continuously and accurately measuring a board thickness distribution in one direction even regardless of an easily deformable thin board, such as an aluminum alloy plate.SOLUTION: A continuous board thickness measuring instrument includes a capacitance type thickness gauge provided with a pair of sensors 11, 12 installed separately and oppositely on a plate surface of a work-piece W, feed rollers 4, 5 provided in front of and behind the sensors 11, 12 to feed the work-piece W in one direction, a placing table 6 having a reference surface having a flat top surface to have the work-piece W to be placed thereon, and a guide plate 7 for pressing the work-piece W on the placing table 6 on both sides of the sensors 11, 12 so as to prevent the work-piece W floating over. The respective feed rollers 4, 5 have metal lower rollers 42, 52 installed with a contact part with the work-piece W on a circumferential surface met with the reference surface, and upper rollers 41, 51 provided with an elastic member on a circumferential surface to sandwich the work-piece W in cooperation with the lower rollers 42, 52 freely contactably and separably with/from the work-piece W.
申请公布号 JP2013145209(A) 申请公布日期 2013.07.25
申请号 JP20120006410 申请日期 2012.01.16
申请人 KOBE STEEL LTD;SPTEC CO LTD 发明人 AKUTSU KOICHI;TSURUMI TOSHIHIKO;NOGUCHI SHIGERU
分类号 G01B7/06;B21B37/00;B21B37/28;B21C51/00 主分类号 G01B7/06
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