发明名称 METHOD AND APPARATUS FOR TESTING ONE TIME PROGRAMMABLE (OTP) ARRAYS
摘要 <p>An array of one time programmable (OTP) devices includes a first set of pre-configurable memory devices appended to one or more columns of the array and a second set of pre-configurable memory devices appended to one or more rows of the array. The pre-configurable memory devices may be additional OTP devices or read only memory (ROM) devices that can be configured to store a predetermined test pattern for the array. Rows, columns and functionalities of the array can be tested based on the stored test pattern. OTP devices in the array may then be programmed after successful testing based on the test pattern stored.</p>
申请公布号 WO2013110016(A1) 申请公布日期 2013.07.25
申请号 WO2013US22339 申请日期 2013.01.20
申请人 QUALCOMM INCORPORATED 发明人 UVIEGHARA, GREGORY A;CASSIER, AMER CHRISTOPHE G.;KOTA, ANIL C.
分类号 G11C29/24;G11C17/14;G11C29/02 主分类号 G11C29/24
代理机构 代理人
主权项
地址