发明名称 MEASUREMENT APPARATUS, PROGRAM, AND MEASUREMENT METHOD
摘要 PROBLEM TO BE SOLVED: To provide a measurement apparatus, a program, and a measurement method that are suitable for measurement of samples contained in a plurality of wells over a predetermined period of time by using a microscope.SOLUTION: There is provided a measurement apparatus including an objective lens, a stage, a setting unit, and a controller. The stage is configured to support a sample vessel in which a plurality of wells each containing a sample are arranged and to define relative positions of the sample vessel and the objective lens. The setting unit is configured to determine whether to set each of the plurality of wells to be a measurement target. The controller is configured to control the stage such that a well determined to be the measurement target by the setting unit and the objective lens face each other.
申请公布号 JP2013145318(A) 申请公布日期 2013.07.25
申请号 JP20120005682 申请日期 2012.01.13
申请人 SONY CORP 发明人 TANAKA HIDEKAZU;TAMAI MASANOBU;MORIKAWA HIROAKI;TATSUTA HIROKAZU;DOWAKI MASARU;HAYAKAWA TOMOHIRO;MATSUI ERIKO;HASEGAWA MAKOTO;MINAGAWA TATSUYA
分类号 G02B21/26;C12M1/34;G02B21/36 主分类号 G02B21/26
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