发明名称 SCAN HEAD AND SCAN ARM USING THE SAME
摘要 A scan head assembled to a scan arm for an ion implanter and a scan arm using the same are provided, wherein the scan head is capable of micro tilting a work piece and comprises a case, a shaft assembly, an electrostatic chuck, a first driving mechanism and a micro-tilt mechanism. The shaft assembly passes through a first side of the case and has a twist axis. The electrostatic chuck is fastened on a first end of the shaft assembly outside the case for holding the work piece. The first driving mechanism is disposed within the case and capable of driving the shaft assembly and the ESC to rotate about the twist axis. The micro-tilt mechanism is disposed within the case and capable of driving the shaft assembly and the ESC to tilt relative to the case.
申请公布号 US2013187349(A1) 申请公布日期 2013.07.25
申请号 US201313745426 申请日期 2013.01.18
申请人 ADVANCED ION BEAM TECHNOLOGY, INC.;ADVANCED ION BEAM TECHNOLOGY, INC. 发明人 MCRAY RICHARD F.
分类号 H01L21/683 主分类号 H01L21/683
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