发明名称 ROTATED CHANNEL SEMICONDUCTOR FIELD EFFECT TRANSISTOR
摘要 <p>A transistor device, such as a rotated channel metal oxide/insulator field effect transistor (RC- MO(I)SFET), includes a substrate including a non-polar or semi-polar wide band gap substrate material such as an AI2O3 or a ZnO or a Group-Ill Nitride-based material, and a first structure disposed on a first side of the subsiraie comprising of AlInGaN -based and/or ZnMgO based semiconducting materials. The first structure further includes an intentional current-conducting sidewall channel or facet whereupon additional semiconductor layers, dielectric layers and electrode layers are disposed and upon which the field effect of the dielectric and electrode layers occurs thus allowing for a high density monolithic integration of a multiplicity of discrete devices on a common substrate thereby enabling a higher power density than in conventional lateral power MOSFET devices.</p>
申请公布号 WO2013109628(A1) 申请公布日期 2013.07.25
申请号 WO2013US21744 申请日期 2013.01.16
申请人 RAMGOSS, INC. 发明人 ADEKORE, BUNMI, T.;FIORENZA, JAMES
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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