发明名称 |
AQUEOUS DISPERSION FOR CHEMICAL MECHANICAL POLISHING, AND CHEMICAL MECHANICAL POLISHING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide an aqueous dispersion for chemical mechanical polishing capable of achieving both a high-polishing speed and suppression of corrosion generation to an aluminum film and its alloy film at a semiconductor device manufacturing step, and of showing a good storage stability, and provide a chemical mechanical polishing method using the same.SOLUTION: An aqueous dispersion for chemical mechanical polishing contains: (A) 0.1 mass% or more and 10 mass% or less of abrasive grains; and (B) 0.01 mass% or more and 2 mass% or less of a phosphate ester compound having a 1-5C organic group. The pH is 1 or more and 4 or less. |
申请公布号 |
JP2013145877(A) |
申请公布日期 |
2013.07.25 |
申请号 |
JP20120272158 |
申请日期 |
2012.12.13 |
申请人 |
JSR CORP |
发明人 |
KUSHIDA YUKI;HOSHINO MOTOKI;SHINOMURA HISASHI;NODA MASAHIRO;KONNO TOMOHISA |
分类号 |
H01L21/304;B24B37/00;C09K3/14 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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