发明名称 LIGHT MEASUREMENT METHOD AND MEASUREMENT DEVICE USING OPTICAL-ELECTRIC FIELD ENHANCEMENT DEVICE
摘要 <p>[Problems to be Solved] To achieve a measurement with an improved signal-to-noise ratio in a measurement method in which an optical enhancement effect of localized plasmon is used to enhance and detect weak light generated from a subject. [Means for Solving the Problems] Performing a measurement using an optical field enhancement device (1) which includes a transparent substrate (10) having a transparent fine uneven structure (22) on a surface and a metal film (24) formed on a surface of the fine uneven structure on the surface of the substrate, in which a subject (S) is placed on the metal film (24) of the optical field enhancement device (1), then excitation light (L1) is projected onto an area of the optical field enhancement device (1) on which the subject (S) is placed, and light generated by the projection of the excitation light (L1) is detected from a back surface side of the transparent substrate (10).</p>
申请公布号 EP2618134(A1) 申请公布日期 2013.07.24
申请号 EP20110824737 申请日期 2011.09.05
申请人 FUJIFILM CORPORATION 发明人 NAYA, MASAYUKI;HAKUTA, SHINYA
分类号 G01N21/65;G01N21/64 主分类号 G01N21/65
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