| 摘要 |
The x-ray detector comprises a scintillator, a position for a material under test, an x-ray source, and a structure configured to perturb an x-ray energy spectrum, each lying on a common axis. The structure lies between the x-ray source and the scintillator and comprises at least three adjacent regions, each region different to immediately adjacent regions and configured to perturb the x-ray energy spectrum differently. Use of different thicknesses, materials, different layers of wire mesh or foil including apertures are described. A further use of arrays of protrusions and depressions is described, as is determining a material property from measurements made. |
