发明名称 Defect detection and correction via monitoring of syndromes and bit flips in decoder
摘要 A defect detection and correction system includes a decoder module configured to decode data received from a data storage device and output the data and a plurality of confidence indicators associated with respective bits of the data. A digital defect detection module is configured to compare each of the confidence indicators in a window of W bits of the data to a confidence threshold, identify a number of bits in the window of W bits as defective based on the comparison, mark all of the bits in the window of W bits as defective if the number of bits is greater than a bit threshold, and generate a defect indicator identifying the window of W bits as defective.
申请公布号 US8495479(B1) 申请公布日期 2013.07.23
申请号 US201113299616 申请日期 2011.11.18
申请人 VARNICA NEDELJKO;BURD GREGORY;MARVELL INTERNATIONAL LTD. 发明人 VARNICA NEDELJKO;BURD GREGORY
分类号 H03M13/03;H03M13/00 主分类号 H03M13/03
代理机构 代理人
主权项
地址