发明名称 |
Atomic layer deposition encapsulation for power amplifiers in RF circuits |
摘要 |
Power amplifiers and methods of coating a protective film of alumina (Al2O3) on the power amplifiers are disclosed herein. The protective film is applied through an atomic layer deposition (ALD) process. The ALD process can deposit very thin layers of alumina on the surface of the power amplifier in a precisely controlled manner. Thus, the ALD process can form a uniform film that is substantially free of free of pin-holes and voids.
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申请公布号 |
US8492908(B2) |
申请公布日期 |
2013.07.23 |
申请号 |
US201213654894 |
申请日期 |
2012.10.18 |
申请人 |
RF MICRO DEVICES, INC. |
发明人 |
SIOMKOS JOHN R.;HATCHER, JR. MERRILL ALBERT;RAO JAYANTI JAGANATHA |
分类号 |
H01L23/29 |
主分类号 |
H01L23/29 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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