发明名称 Atomic layer deposition encapsulation for power amplifiers in RF circuits
摘要 Power amplifiers and methods of coating a protective film of alumina (Al2O3) on the power amplifiers are disclosed herein. The protective film is applied through an atomic layer deposition (ALD) process. The ALD process can deposit very thin layers of alumina on the surface of the power amplifier in a precisely controlled manner. Thus, the ALD process can form a uniform film that is substantially free of free of pin-holes and voids.
申请公布号 US8492908(B2) 申请公布日期 2013.07.23
申请号 US201213654894 申请日期 2012.10.18
申请人 RF MICRO DEVICES, INC. 发明人 SIOMKOS JOHN R.;HATCHER, JR. MERRILL ALBERT;RAO JAYANTI JAGANATHA
分类号 H01L23/29 主分类号 H01L23/29
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