发明名称 Surface inspection apparatus
摘要 A surface inspection apparatus includes an irradiating unit that has a plurality of light sources that respectively emit a plurality of illumination light beams having different wavelength ranges, and irradiates an inspection surface as a surface of a body to be inspected with the illumination light beams, in a condition where the light sources are located adjacent to each other and arranged in a given order along the inspection surface, an imaging unit that images reflected light when the illumination light beams are reflected by the inspection surface, so as to obtain a plurality of items of image data corresponding to the respective wavelength ranges, and a control unit that detects a detection object on the inspection surface, based on the items of image data corresponding to the respective wavelength ranges which are obtained by the imaging unit.
申请公布号 US8493558(B2) 申请公布日期 2013.07.23
申请号 US20090575543 申请日期 2009.10.08
申请人 ASADA YASUNORI;MIYAZATO NORIO;YAMAZAKI EIJI;TOYOTA JIDOSHA KABUSHIKI KAISHA 发明人 ASADA YASUNORI;MIYAZATO NORIO;YAMAZAKI EIJI
分类号 G01N21/00;G01B11/24;G06K9/00 主分类号 G01N21/00
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