发明名称 METHOD OF FORMING THROUGH SILICON VIA USING LASER ABLATION
摘要 <p>PURPOSE: A method of forming a through-silicon via by using laser ablation is provided to form a long groove firstly and form a through-hole by using a grinding process secondly, thereby simplifying a process of forming the through-silicon via. CONSTITUTION: A method of forming through-silicon vias by using laser ablation comprises the steps of: preparing a silicon wafer (210); laser drilling to form a plurality of grooves (220) by irradiating a laser beam (L) onto a first surface (211) of the silicon wafer; and grinding a second surface (212) of the silicon wafer to form a plurality of through-silicon vias by exposing the grooves on the second surface of the silicon wafer. The step of laser drilling comprises using an ultrashort pulse laser (230). In the step of grinding, an upper surface of the silicon wafer is ground.</p>
申请公布号 KR20130083721(A) 申请公布日期 2013.07.23
申请号 KR20120004508 申请日期 2012.01.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, EUI SEOK;BANG, SANG KYU;CHO, SOO HYUN;JI, WON SOO;KIM, CHOO HO
分类号 H01L33/48;H01L23/045 主分类号 H01L33/48
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