发明名称 Method of forming capacitor structure
摘要 In a capacitor structure and method of forming the same, a first electrode, a second electrode, and a first insulation layer are sequentially formed on a substrate. The first and second electrodes and the first insulation layer are covered with a second insulation layer on the substrate. A first plug is in contact with the second electrode through the second insulation layer. A second plug is in contact with the first electrode through the first and second insulation layer. A third insulation layer is formed on the second insulation layer. Third and fourth comb-shaped electrodes are formed in the third insulation layer. The third electrode is contact with the first plug and the fourth electrode is contact with the second plug while facing the third electrode. Thus, the teeth of the comb-shaped electrodes are alternately arranged and spaced apart in the third insulation layer.
申请公布号 US8493709(B2) 申请公布日期 2013.07.23
申请号 US201213401233 申请日期 2012.02.21
申请人 CHUNG CHUL-HO;SAMSUNG ELECTRONICS CO., LTD. 发明人 CHUNG CHUL-HO
分类号 H01G4/30 主分类号 H01G4/30
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