发明名称 Chemical mechanical polishing aqueous dispersion and chemical mechanical polishing method
摘要 A chemical mechanical polishing aqueous dispersion is used to polish a polishing target that includes an interconnect layer that contains tungsten. The chemical mechanical polishing aqueous dispersion includes: (A) a cationic water-soluble polymer; (B) an iron (III) compound; and (C) colloidal silica particles. The content (MA) (mass %) of the cationic water-soluble polymer (A) and the content (MB) (mass %) of the iron (III) compound (B) satisfy the relationship "MA/MB=0.004 to 0.1". The chemical mechanical polishing aqueous dispersion has a pH of 1 to 3.
申请公布号 US8492276(B2) 申请公布日期 2013.07.23
申请号 US20090537766 申请日期 2009.08.07
申请人 ABE TAICHI;SHIDA HIROTAKA;TAKEMURA AKIHIRO;MENO MITSURU;HIRASAWA SHINICHI;IWADE KENJI;NISHIOKA TAKESHI;JSR CORPORATION;KABUSHIKI KAISHA TOSHIBA 发明人 ABE TAICHI;SHIDA HIROTAKA;TAKEMURA AKIHIRO;MENO MITSURU;HIRASAWA SHINICHI;IWADE KENJI;NISHIOKA TAKESHI
分类号 B24B37/00;C09K3/14;H01L21/304 主分类号 B24B37/00
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