发明名称 |
Spring contact pin for an ic test socket and the like |
摘要 |
A spring contact pin includes a depressible probe member having a tapered configuration that prevents contact between the projecting end of the probe member and the end of the spring barrel throughout the compression and release cycle of the probe. The tapered configuration of the depressible probe member improves the mechanical performance, reliability, and high-speed signal performance of the contact pin.
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申请公布号 |
US8493085(B2) |
申请公布日期 |
2013.07.23 |
申请号 |
US20100749297 |
申请日期 |
2010.03.29 |
申请人 |
BARABI NASSER;KRYACHEK OKSANA;HO CHEE-WAH;ESSAI, INC. |
发明人 |
BARABI NASSER;KRYACHEK OKSANA;HO CHEE-WAH |
分类号 |
G01R31/20 |
主分类号 |
G01R31/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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