发明名称 RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN
摘要 PROBLEM TO BE SOLVED: To provide a method for forming a negative resist pattern having high resolution and good shape and a resist composition.SOLUTION: There are provided a method for forming a resist pattern comprising the steps of: (1) forming a resist film by applying a resist composition containing a base material component whose solubility to an alkali developer is increased by the action of an acid and a compound represented by the general formula (c1) on a substrate; (2) exposing the resist film; (3) performing baking after the step (2); and (4) alkali developing the resist film to form a negative resist pattern in which an unexposed part of the resist film is removed by dissolving, and the resist composition used in the step (1), wherein, Ris a group forming an aromatic ring together with two carbon atoms to which the Ris bonded, Ris a hydrogen atom or a hydrocarbon group, and Ris a hydrogen atom, a carboxyl group or a hydrocarbon group having 1 to 15 carbon atoms.
申请公布号 JP2013142810(A) 申请公布日期 2013.07.22
申请号 JP20120003412 申请日期 2012.01.11
申请人 TOKYO OHKA KOGYO CO LTD 发明人 SHIMIZU HIROAKI;YOKOYA JIRO;NAKAMURA TAKESHI;NITO TAKEHITO
分类号 G03F7/004;G03F7/038;H01L21/027 主分类号 G03F7/004
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