发明名称 CIRCUIT BOARD INSPECTION DEVICE AND CIRCUIT BOARD INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To improve inspection accuracy.SOLUTION: A circuit board inspection device includes: a probe unit 12 having a plurality of probe pins (22a, 22b); a measurement unit for measuring a capacitance between each of inspection points P of a circuit board 100; and an inspection unit for inspecting the circuit board 100 on the basis of the measured capacitance. The measurement unit performs: first measurement processing which measures a stray capacitance between each of probe pins to be applied to each of first inspection points (Pa1, Pa2) as measuring objects of the capacitance in a state where probing processing is not performed, and second measurement processing which measures the capacitance when the probing processing is performed in a state where an insulation sheet 13 is not interposed between each first inspection point P and each probe pin and also the insulation sheet 13 is interposed between a second inspection point Pb which is not the measuring object of the capacitance and the probe pin. The inspection unit inspects the circuit board 100 on the basis of the capacitance after subtracting the stray capacitance from the capacitance.
申请公布号 JP2013142621(A) 申请公布日期 2013.07.22
申请号 JP20120003258 申请日期 2012.01.11
申请人 HIOKI EE CORP 发明人 MURAYAMA RINTARO;SHIOIRI AKIHIRO
分类号 G01R31/02;H05K3/00 主分类号 G01R31/02
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