发明名称 |
PROBE SHAPE EVALUATION METHOD OF SCANNING PROBE MICROSCOPE |
摘要 |
PROBLEM TO BE SOLVED: To evaluate a probe tip shape in a scanning probe microscope.SOLUTION: A probe tip shape is measured in accordance with a probe shape verification sample having a needle-shaped structure, the radiuses of cross sections within a plurality of distances from a tip are calculated and a curvature radius in the case where the probe tip shape is approximated with a circle is calculated based on the radiuses. |
申请公布号 |
JP2013142586(A) |
申请公布日期 |
2013.07.22 |
申请号 |
JP20120002366 |
申请日期 |
2012.01.10 |
申请人 |
HITACHI HIGH-TECH SCIENCE CORP |
发明人 |
WATANABE MASASHI;MOMOTA HIROMI |
分类号 |
G01Q40/02 |
主分类号 |
G01Q40/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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