发明名称 PROBE SHAPE EVALUATION METHOD OF SCANNING PROBE MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To evaluate a probe tip shape in a scanning probe microscope.SOLUTION: A probe tip shape is measured in accordance with a probe shape verification sample having a needle-shaped structure, the radiuses of cross sections within a plurality of distances from a tip are calculated and a curvature radius in the case where the probe tip shape is approximated with a circle is calculated based on the radiuses.
申请公布号 JP2013142586(A) 申请公布日期 2013.07.22
申请号 JP20120002366 申请日期 2012.01.10
申请人 HITACHI HIGH-TECH SCIENCE CORP 发明人 WATANABE MASASHI;MOMOTA HIROMI
分类号 G01Q40/02 主分类号 G01Q40/02
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