发明名称 |
METHOD FOR CLEAVING SEMICONDUCTOR WAFERS |
摘要 |
PURPOSE: A wafer cleaving method is provided to reduce the difficulty of a separation layer forming process by forming a separation layer to include a plurality of microvoids. CONSTITUTION: A plurality of trenches are formed on a first wafer (11). A plurality of microvoids (12A) are formed from the trenches by a thermal process to induce migration. The thermal process is performed under a hydrogen atmosphere between 700 and 1400 degrees centigrade. The first wafer with a separation layer (100) including the microvoids is bonded to a second wafer. The first wafer is separated from the second wafer by a cleaving process.
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申请公布号 |
KR20130082361(A) |
申请公布日期 |
2013.07.19 |
申请号 |
KR20120003543 |
申请日期 |
2012.01.11 |
申请人 |
SK HYNIX INC. |
发明人 |
CHO, HEUNG JAE;OH, JAE GEUN |
分类号 |
H01L21/20;H01L27/12 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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