发明名称 METHOD FOR CLEAVING SEMICONDUCTOR WAFERS
摘要 PURPOSE: A wafer cleaving method is provided to reduce the difficulty of a separation layer forming process by forming a separation layer to include a plurality of microvoids. CONSTITUTION: A plurality of trenches are formed on a first wafer (11). A plurality of microvoids (12A) are formed from the trenches by a thermal process to induce migration. The thermal process is performed under a hydrogen atmosphere between 700 and 1400 degrees centigrade. The first wafer with a separation layer (100) including the microvoids is bonded to a second wafer. The first wafer is separated from the second wafer by a cleaving process.
申请公布号 KR20130082361(A) 申请公布日期 2013.07.19
申请号 KR20120003543 申请日期 2012.01.11
申请人 SK HYNIX INC. 发明人 CHO, HEUNG JAE;OH, JAE GEUN
分类号 H01L21/20;H01L27/12 主分类号 H01L21/20
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