| 摘要 |
PURPOSE: An integrated circuit (IC) test card having an improved electric contact structure of a probe is provided to prevent a circuit board from being broken although the circuit board is loaded for long time. CONSTITUTION: An IC test card includes a circuit board (42), a cantilever type probe, a first support structure (44') and a second support structure. The circuit board includes malleable guide bars. The cantilever type probe includes a rear end part (41), a curved part (43), a connecting arm (45) and a pointed part. The connecting arm connects the pointed part and the curved part. The rear end part connects the curved part with the malleable guide bars. The connecting arm and a horizontal line are formed a first narrow angle (55), and the curved part and the horizontal line are formed a second narrow angle (57). The first narrow angle and the second narrow angle are differently formed. The first support structure formed on the circuit board supports the curved part. The second support structure formed on the circuit board supports the connecting arm.
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