发明名称 OPTICAL SYSTEM FOR A MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS AND MICROLITHOGRAPHIC EXPOSURE METHOD
摘要 The invention relates to an optical system for a microlithographic projection exposure apparatus, and to a microlithographic exposure method. An optical system for a microlithographic projection exposure apparatus comprises a polarization-influencing optical arrangement (100, 200, 250), wherein the polarization-influencing optical arrangement (100, 200, 250) comprises at least one first array (110, 210, 260) of first polarization-influencing elements (110a, 110b, 110c,...; 310a, 310b, 310c,...; 410a, 410b, 410c,...; 510a;...) and a second array (120, 220, 270) of second polarization-influencing elements (120a, 120b, 120c,...), wehrein the first and second arrays are arranged successively in the light propogation direction, wherein the first and second polarization-influencing elements in each case have a birefringence that is dependent on the presence of an electric field, and wherein the first polarization-influencing elements (110a, 110b, 110c,...; 310a, 310b, 310c,...; 410a, 410b, 410c,...; 510a;...) and the second polarization-influencing elements (120a, 120b, 120c,...) are transverse Pockels cells.
申请公布号 WO2013104477(A1) 申请公布日期 2013.07.18
申请号 WO2012EP75122 申请日期 2012.12.11
申请人 CARL ZEISS SMT GMBH;SAENGER, INGO;SCHLESENER, FRANK 发明人 SAENGER, INGO;SCHLESENER, FRANK
分类号 G03F7/20 主分类号 G03F7/20
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