发明名称 |
SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD, AND STORAGE MEDIUM |
摘要 |
PROBLEM TO BE SOLVED: To provide a substrate processing apparatus which smooths a surface of a pattern mask formed on a substrate, suppresses leakage of a solvent from a processing container to the outside and prevents deterioration of throughput.SOLUTION: A substrate processing apparatus comprises: a compartment mechanism for switching a transferring region for transferring a substrate between the outside of a processing container and the inside of a processing space and an adjacent region adjacent to the transferring region so as to switch a state that their atmospheres are interrupted and a state that their atmospheres are released; a solvent atmosphere supplying part for supplying the solvent atmosphere to the processing space in a state that each regions is released and for swelling a pattern mask of a substrate placed on a mounting part for processing; a substrate carrying-in opening for opening/closing to the transferring region in a state that each region is partitioned; and an air outlet for exhausting and removing the solvent atmosphere in the transferring region in the partitioned state. Thereby an exhaust volume is reduced to quickly carry-in/out the substrate. |
申请公布号 |
JP2013140836(A) |
申请公布日期 |
2013.07.18 |
申请号 |
JP20110289824 |
申请日期 |
2011.12.28 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
KOBAYASHI SHINJI |
分类号 |
H01L21/027;G03F7/40;H01L21/677 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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