| 摘要 |
PURPOSE: A semiconductor device is provided to reduce a test time by increasing the number of performed tests in a probe card. CONSTITUTION: A semiconductor device includes an external signal input terminal (100) and a test control circuit unit (200). The external signal input terminal is connected to an external device outputting an electrical signal and outputs the electrical signal to a first node (n1). The test control circuit unit outputs ground voltage or an output signal of the first node to a second node (n2). The test control circuit unit outputs ground voltage to the second node when a test signal is activated and outputs an electrical signal to the second node when the test signal is deactivated.
|
