发明名称 LIGHT MEASUREMENT METHOD AND MEASUREMENT APPARATUS USING AN OPTICAL FIELD ENHANCEMENT DEVICE
摘要 Performing a measurement using an optical field enhancement device which includes a transparent substrate having a transparent fine uneven structure on a surface and a metal film formed on a surface of the fine uneven structure on the surface of the substrate, in which a subject is placed on the metal film of the optical field enhancement device, then excitation light is projected onto an area of the optical field enhancement device on which the subject is placed, and light generated by the projection of the excitation light is detected from a back surface side of the transparent substrate.
申请公布号 US2013182248(A1) 申请公布日期 2013.07.18
申请号 US201313785608 申请日期 2013.03.05
申请人 FUJIFILM CORPORATION;FUJIFILM CORPORATION 发明人 NAYA MASAYUKI;HAKUTA SHINYA
分类号 G01N21/65;G01N21/63;G01N21/64 主分类号 G01N21/65
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