发明名称 METHOD AND APPARATUS FOR BREAKING SEMICONDUCTOR WAFERS
摘要 <p>An apparatus and method for breaking a semiconductor wafer along scribe lines to separate individual die. A scribe line of the wafer is aligned with a straight, elongated pyramid-shaped edge of a precision bending bar, and a compressive force is applied to the surface of the wafer by a compressive member to bend the wafer over the edge and break the wafer along the scribe line.</p>
申请公布号 EP1941540(B1) 申请公布日期 2013.07.17
申请号 EP20060788624 申请日期 2006.07.27
申请人 DYNATEX INTERNATIONAL (CALIFORNIA CORPORATION) 发明人 BAYLIS, WILLIAM, H.;TYLER, JOHN, E.
分类号 H01L21/44;H01L21/301;H01L21/46 主分类号 H01L21/44
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