发明名称 |
Trench-gate MISFET |
摘要 |
A transistor (50) has an insulated control contact (61) within a trench (56). The transistor comprises a pair of semiconductor mesas (65) defining the trench, each semiconductor mesa of the pair of semiconductor mesas comprising at least one p-n junction. A drift layer (55) of a first conductivity type extends between the pair of semiconductor mesas and beneath the trench. A first doped well (77) of a second conductivity type extends from a first semiconductor mesa of the pair of semiconductor mesas to a depth within the drift layer that is greater than a depth of the trench. A source contact (60) is in direct contact with the first doped well. |
申请公布号 |
EP2615642(A1) |
申请公布日期 |
2013.07.17 |
申请号 |
EP20130161683 |
申请日期 |
2008.12.05 |
申请人 |
CREE, INC. |
发明人 |
ZHANG, QINGCHUN;AGARWAL, ANANT;JONAS, CHARLOTTE |
分类号 |
H01L29/04;H01L29/06;H01L29/08;H01L29/10;H01L29/24;H01L29/739;H01L29/749;H01L29/78 |
主分类号 |
H01L29/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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