发明名称 Trench-gate MISFET
摘要 A transistor (50) has an insulated control contact (61) within a trench (56). The transistor comprises a pair of semiconductor mesas (65) defining the trench, each semiconductor mesa of the pair of semiconductor mesas comprising at least one p-n junction. A drift layer (55) of a first conductivity type extends between the pair of semiconductor mesas and beneath the trench. A first doped well (77) of a second conductivity type extends from a first semiconductor mesa of the pair of semiconductor mesas to a depth within the drift layer that is greater than a depth of the trench. A source contact (60) is in direct contact with the first doped well.
申请公布号 EP2615642(A1) 申请公布日期 2013.07.17
申请号 EP20130161683 申请日期 2008.12.05
申请人 CREE, INC. 发明人 ZHANG, QINGCHUN;AGARWAL, ANANT;JONAS, CHARLOTTE
分类号 H01L29/04;H01L29/06;H01L29/08;H01L29/10;H01L29/24;H01L29/739;H01L29/749;H01L29/78 主分类号 H01L29/04
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