发明名称 APPARATUS FOR MAPPING AND HIGH RESOLUTION ANALYSIS OF ELEMENTS IN SOLIDS
摘要 <p>A device is provided for mapping and for analysis of at least one element of interest included in a solid sample by laser-induced plasma optical emission spectrometry, enabling a high-resolution mapping, notably of elements such as hydrogen and oxygen, and is applicable to the fields of the nuclear industry and of aeronautics, and notably offers the advantage of not requiring costly installations. In one of the embodiments of the invention, a simultaneous mapping of elements such as hydrogen, oxygen and/or lithium is notably achievable.</p>
申请公布号 EP2614363(A1) 申请公布日期 2013.07.17
申请号 EP20110754371 申请日期 2011.09.06
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIESALTERNATIVES 发明人 LACOUR, JEAN-LUC;CARON, NADEGE;BERANGER, KEVIN
分类号 G01N21/71;G01J3/02;G01J3/443 主分类号 G01N21/71
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