| 发明名称 |
METHOD AND APPARATUS FOR MEASURING BIOMETRICS OF OBJECT. |
| 摘要 |
A method and apparatus for automatically measuring biometrics of an object. The method includes receiving an image of an object (S301), modeling the object such that at least one part thereof may be identified (S303), and measuring biometrics of the object based on a result of modeling the object (S305).
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| 申请公布号 |
MX2013000151(A) |
申请公布日期 |
2013.07.16 |
| 申请号 |
MX20130000151 |
申请日期 |
2013.01.07 |
| 申请人 |
SAMSUNG ELECTRONICS CO., LTD.* |
发明人 |
HAE-KYUNG JUNG;MYUNG-JIN EOM;HEE-CHUL YOON;HYUN-TAEK LEE;YONG-JE KIM;JAE-HYUN KIM |
| 分类号 |
A61B5/117 |
主分类号 |
A61B5/117 |
| 代理机构 |
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