发明名称 System and method for root cause analysis of the failure of a manufactured product
摘要 A system, method and computer program product for the root cause analysis of the failure of a manufactured product is disclosed. The present invention includes the development of a knowledge model, based on information obtained from historical warranty claim forms and various manufacturing data sources. The invention also includes processing text information in a free-form text that is obtained from warranty claim forms by using text-tagging and annotation techniques. Thereafter, the knowledge model is converted to a Bayesian network. The present invention provides a user interface to select parameters and corresponding instances from current warranty claim forms. The selected parameters and corresponding instances are used as input evidence for the Bayesian network. The present invention facilitates the process of drawing inferences for root cause analysis of the failure of manufactured products and corresponding probabilities.
申请公布号 US8489530(B2) 申请公布日期 2013.07.16
申请号 US20080315497 申请日期 2008.12.03
申请人 DE SUDRIPTO;NARASIMHAMURTHY SRINIVAS;SUREKA ASHISH;PRADHAN SATYABRATA;INFOSYS LIMITED 发明人 DE SUDRIPTO;NARASIMHAMURTHY SRINIVAS;SUREKA ASHISH;PRADHAN SATYABRATA
分类号 G06F17/00;G06F7/60;G06F11/00 主分类号 G06F17/00
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