| 摘要 |
An emission analysis device has an image obtaining module configured to obtain a plurality of first images and a plurality of second images by changing multiple times an end test pattern address, the first images being obtained by integrating an emission from a nondefective semiconductor device determined to be nondefective by a function test while test patterns from a predetermined start test pattern address to the end test pattern address are inputted to the nondefective semiconductor device, the second images being obtained by integrating an emission from a defective semiconductor device determined to be defective by the function test while the test patterns from the predetermined start test pattern address to the end test pattern address are inputted to the defective semiconductor device, and a comparator configured to compare each of the first images with each of the second images by the end test pattern address to determine whether there is a difference between the first images and the second images.
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