发明名称 Doped electrode for dram applications
摘要 A metal oxide first electrode layer for a MIM DRAM capacitor is formed wherein the first and/or second electrode layers contain one or more dopants up to a total doping concentration that will not prevent the electrode layers from crystallizing during a subsequent anneal step. One or more of the dopants has a work function greater than about 5.0 eV. One or more of the dopants has a resistivity less than about 1000 muOmega cm. Advantageously, the electrode layers are conductive molybdenum oxide.
申请公布号 US8486780(B2) 申请公布日期 2013.07.16
申请号 US201113219922 申请日期 2011.08.29
申请人 RUI XIANGXIN;ODE HIROYUKI;INTERMOLECULAR, INC.;ELPIDA MEMORY, INC. 发明人 RUI XIANGXIN;ODE HIROYUKI
分类号 H01L21/8242;H01L21/329 主分类号 H01L21/8242
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