发明名称 UBM FORMATION FOR INTEGRATED CIRCUITS
摘要 <p>PURPOSE: A method for forming an under-bump-metallurgy on an integrated circuit is provided to increase the lateral size of the under-bump-metallurgy by horizontally growing the under-bump-metallurgy in an initial plating process. CONSTITUTION: A metal pad (30) is formed on a metal layer (24). A passivation layer (32) is formed on the metal pad. A polymer layer (36) is formed on the passivation layer. An opening part is formed on the polymer layer to expose a part of the metal pad. An under-bump-metallurgy (46) is formed by a chemical plating process. The under-bump-metallurgy includes a part which is extended to the opening part to be connected to the metal pad.</p>
申请公布号 KR20130080748(A) 申请公布日期 2013.07.15
申请号 KR20120026655 申请日期 2012.03.15
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 WU YI WEN;LIM ZHENG YI;HO MING CHE;LIU CHUNG SHI
分类号 H01L21/60 主分类号 H01L21/60
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