发明名称 |
UBM FORMATION FOR INTEGRATED CIRCUITS |
摘要 |
<p>PURPOSE: A method for forming an under-bump-metallurgy on an integrated circuit is provided to increase the lateral size of the under-bump-metallurgy by horizontally growing the under-bump-metallurgy in an initial plating process. CONSTITUTION: A metal pad (30) is formed on a metal layer (24). A passivation layer (32) is formed on the metal pad. A polymer layer (36) is formed on the passivation layer. An opening part is formed on the polymer layer to expose a part of the metal pad. An under-bump-metallurgy (46) is formed by a chemical plating process. The under-bump-metallurgy includes a part which is extended to the opening part to be connected to the metal pad.</p> |
申请公布号 |
KR20130080748(A) |
申请公布日期 |
2013.07.15 |
申请号 |
KR20120026655 |
申请日期 |
2012.03.15 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
WU YI WEN;LIM ZHENG YI;HO MING CHE;LIU CHUNG SHI |
分类号 |
H01L21/60 |
主分类号 |
H01L21/60 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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