<p>PURPOSE: A semiconductor device is provided to implement a 3D semiconductor device with high reliability by preventing the semiconductor device from being damaged. CONSTITUTION: A first separation pattern (90_1) and a second separation pattern (90_2) are formed on a substrate (1). A plurality of interlayer dielectric patterns (6a) and conductive patterns (66a) are formed on the surface of the substrate between the first and second separation patterns. A support pattern (25') passes through the conductive patterns and the interlayer dielectric patterns. A first vertical structure (50_1) passes through the conductive patterns and the interlayer dielectric patterns. A second vertical structure passes through the conductive patterns and the interlayer dielectric patterns.</p>
申请公布号
KR20130080260(A)
申请公布日期
2013.07.12
申请号
KR20120001074
申请日期
2012.01.04
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
SHIM, JAE JOO;KIM, HAN SOO;LEE, WOON KYUNG;LIM, JU YOUNG;HWANG, SUNG MIN