发明名称 SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A semiconductor device is provided to implement a 3D semiconductor device with high reliability by preventing the semiconductor device from being damaged. CONSTITUTION: A first separation pattern (90_1) and a second separation pattern (90_2) are formed on a substrate (1). A plurality of interlayer dielectric patterns (6a) and conductive patterns (66a) are formed on the surface of the substrate between the first and second separation patterns. A support pattern (25') passes through the conductive patterns and the interlayer dielectric patterns. A first vertical structure (50_1) passes through the conductive patterns and the interlayer dielectric patterns. A second vertical structure passes through the conductive patterns and the interlayer dielectric patterns.</p>
申请公布号 KR20130080260(A) 申请公布日期 2013.07.12
申请号 KR20120001074 申请日期 2012.01.04
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SHIM, JAE JOO;KIM, HAN SOO;LEE, WOON KYUNG;LIM, JU YOUNG;HWANG, SUNG MIN
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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