发明名称 FINDING OPTIMAL READ THRESHOLDS AND RELATED VOLTAGES FOR SOLID STATE MEMORY
摘要 An expected value associated with stored values in solid state storage, as well as a set of three or more points are obtained where the three or more points include a voltage and a value associated with stored values. Two points having ratios closest to the expected value are selected from the set. A voltage is determined based at least in part on the selected two points and the expected value.
申请公布号 US2013176775(A1) 申请公布日期 2013.07.11
申请号 US201213691113 申请日期 2012.11.30
申请人 LINK_A_MEDIA DEVICES CORPORATION;LINK_A_MEDIA DEVICES CORPORATION 发明人 TANG XIANGYU;ZENG LINGQI;BELLORADO JASON;LEE FREDERICK K.H.;SUBRAMANIAN ARUNKUMAR
分类号 G11C16/26 主分类号 G11C16/26
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