发明名称 SCANNING MICROSCOPE
摘要 The present invention relates to a scanning microscope, which can acquire an undistorted image of a desired area of a sample using a simple configuration. When a sample is observed, a galvano-scanner rotates a scanning mirror based on a supplied driving signal, so as to scan the sample with illumination light. A sampling circuit samples an electric signal acquired by performing photoelectric conversion on observation light from the sample, in synchronization with a sampling clock. If the scanning mirror is driven so that the rotation angle thereof non-linearly changes with respect to time, the sampling circuit appropriately suppresses sampling based on the sampling clock, so that sampling is executed only when the scanning mirror is at a predetermined position. The present invention can be applied to a scanning microscope.
申请公布号 US2013175433(A1) 申请公布日期 2013.07.11
申请号 US201313762854 申请日期 2013.02.08
申请人 NIKON CORPORATION;NIKON CORPORATION 发明人 KISHIMOTO HIROSHI
分类号 G02B21/36 主分类号 G02B21/36
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