发明名称 IE TYPE TRENCH GATE IGBT
摘要 In a method of further enhancing the performance of a narrow active cell IE type trench gate IGBT having the width of active cells narrower than that of inactive cells, it is effective to shrink the cells so that the IE effects are enhanced. However, when the cells are shrunk simply, the switching speed is reduced due to increased gate capacitance. A cell formation area of the IE type trench gate IGBT is basically composed of first linear unit cell areas having linear active cell areas, second linear unit cell areas having linear hole collector areas and linear inactive cell areas disposed therebetween.
申请公布号 US2013175574(A1) 申请公布日期 2013.07.11
申请号 US201313733211 申请日期 2013.01.03
申请人 RENESAS ELECTRONICS CORPORATION;RENESAS ELECTRONICS CORPORATION 发明人 MATSUURA HITOSHI
分类号 H01L29/66;H01L29/739 主分类号 H01L29/66
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