发明名称 CHARGED PARTICLE BEAM IRRADIATION APPARATUS
摘要 <p>The purpose of the present invention is to provide a charged particle beam irradiation apparatus of a relatively simple structure which performs cooling on a sample or a sample stage. An aspect of the present invention comprises: a charged particle source; a sample stage; and a driving mechanism that comprises a transmission mechanism which transmits a driving force to move the sample stage. The charged particle beam irradiation apparatus comprises a container capable of accommodating an ionic liquid (12), wherein the container is disposed in a vacuum chamber. When the ionic liquid (12) is accommodated in the container, at least a portion of the transmission mechanism is provided at a position submerged in the ionic liquid (12).</p>
申请公布号 WO2013103107(A1) 申请公布日期 2013.07.11
申请号 WO2012JP83439 申请日期 2012.12.25
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 KANEKO ASAKO;TAKASU HISAYUKI;MUTOU HIROBUMI
分类号 H01J37/305;H01J37/20 主分类号 H01J37/305
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