发明名称 LOW TEMPERATURE LAYER TRANSFER PROCESS USING DONOR STRUCTURE WITH MATERIAL IN RECESSES IN TRANSFER LAYER, SEMICONDUCTOR STRUCTURES FABRICATED USING SUCH METHODS
摘要 Methods of transferring a layer of semiconductor material from a first donor structure to a second structure include forming recesses in the donor structure, implanting ions into the donor structure to form a generally planar, inhomogeneous weakened zone therein, and providing material within the recesses. The first donor structure may be bonded to a second structure, and the first donor structure may be fractured along the generally planar weakened zone, leaving the layer of semiconductor material bonded to the second structure. Semiconductor devices may be fabricated by forming active device structures on the transferred layer of semiconductor material. Semiconductor structures are fabricated using the described methods.
申请公布号 US2013175672(A1) 申请公布日期 2013.07.11
申请号 US201313777231 申请日期 2013.02.26
申请人 SOITEC;SOITEC 发明人 SADAKA MARIAM;RADU IONUT
分类号 H01L21/762;H01L29/06 主分类号 H01L21/762
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