发明名称 DEVICE STRUCTURE FOR LONG ENDURANCE MEMRISTORS
摘要 A memristor includes a first electrode formed of a first metal, a second electrode formed of a second material, wherein the second material comprises a different material from the first metal, and a switching layer positioned between the first electrode and the second electrode. The switching layer is formed of a composition of a first material comprising the first metal and a second nonmetal material, in which the switching layer is in direct contact with the first electrode and in which at least one conduction channel is configured to be formed in the switching layer from an interaction between the first metal and the second nonmetal material.
申请公布号 US2013175497(A1) 申请公布日期 2013.07.11
申请号 US201013822227 申请日期 2010.09.27
申请人 YANG JIANHUA;ZHANG MINXIAN MAX;WILLIAMS R. STANLEY;HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. 发明人 YANG JIANHUA;ZHANG MINXIAN MAX;WILLIAMS R. STANLEY
分类号 H01L45/00;H01L27/24 主分类号 H01L45/00
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