发明名称 INSPECTION AREA SETTING METHOD FOR IMAGE INSPECTING DEVICE
摘要 An image inspecting device is provided with an inspection area setting means which takes an image of a sample to be inspected, and uses the resulting sample image to set in advance the inspection area to be used in the inspection process. The inspection area setting means seeks the optimal solution for the inspection area by evaluating both the pixel resolution of the colors or brightness between the inside and outside of the inspection area and the edge overlap between the contours and edges of the inspection area based on color or brightness information from each pixel in the sample image and edge information included in the sample image. Also, the inspection area setting means adjusts the weighting when evaluating the pixel resolution and edge overlap using balance parameters inputted by the user.
申请公布号 WO2013103032(A1) 申请公布日期 2013.07.11
申请号 WO2012JP71758 申请日期 2012.08.29
申请人 OMRON CORPORATION;MINATO YOSHIHISA;YANAGAWA YUKIKO 发明人 MINATO YOSHIHISA;YANAGAWA YUKIKO
分类号 G01N21/88 主分类号 G01N21/88
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