发明名称 INDICATOR TESTING SYSTEM
摘要 An indicator testing system for testing a plurality of indicators disposed on an electronic product and adapted to display a status includes a plurality of light sensors, a holder for holding the light sensors, and a signal processing module. The light sensors correspond in position to the indicators on the electronic product, respectively, and each generate a corresponding light testing signal whereby the signal processing module generates a brightness testing signal related to each indicator. The indicator testing system speeds up an indicator test, enhances the precision of the indicator test, and ensures the quality of the electronic product.
申请公布号 US2013175434(A1) 申请公布日期 2013.07.11
申请号 US201213432474 申请日期 2012.03.28
申请人 HUANG WEI-HSIANG;WU CHENG-HUNG;HSIEH CHING-FENG;ASKEY COMPUTER CORP.;ASKEY TECHNOLOGY (JIANGSU) LTD. 发明人 HUANG WEI-HSIANG;WU CHENG-HUNG;HSIEH CHING-FENG
分类号 G01J1/42 主分类号 G01J1/42
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