发明名称 PHOTOMASK AND METHOD FOR MANUFACTURING THE SAME, AND PATTERN TRANSFER METHOD
摘要 PROBLEM TO BE SOLVED: To provide a photomask which resolves a pattern of 3 μm or less, for instance, incapable of being resolved under exposure conditions of an alligner used in conventional manufacturing processes of a liquid crystal display device, and obtains a more precise transfer image.SOLUTION: The photomask comprises a light transmitting portion;and a semitransmitting portion which have a predetermined pattern formed thereon by patterning a semitransmitting film formed on a transparent substrate, and forms a transfer pattern having a line width of less than 3 μm on a body to be transferred by exposure light having transmitted through the photomask. The semitransmitting film has a phase difference between exposure light transmitting through the semitransmitting portion and exposure light transmitting through the light transmitting portion of 60 degrees or less. The photomask includes a pattern formed of a light transmitting portion and a semitransmitting portion including a portion having a line width of less than 3 μm in at least one of the transmitting portion and the semitransmitting portion.
申请公布号 JP2013137576(A) 申请公布日期 2013.07.11
申请号 JP20130080541 申请日期 2013.04.08
申请人 HOYA CORP 发明人 SANO MICHIAKI
分类号 G03F1/00;G03F1/28;G03F1/54;G03F7/20;H01L21/027 主分类号 G03F1/00
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