发明名称 METHOD OF MAKING SEMICONDUCTOR DEVICE
摘要 A semiconductor device includes a sensor portion, a cap portion, and an ion-implanted layer. The sensor portion has a sensor structure at a surface portion of a surface. The cap portion has first and second surfaces opposite to each other and includes a through electrode. The surface of the sensor portion is joined to the first surface of the cap portion such that the sensor structure is sealed between the sensor portion and the cap portion. The ion-implanted layer is located on the second surface of the cap portion. The through electrode extends from the first surface to the second surface and is exposed through the ion-implanted layer.
申请公布号 US2013178008(A1) 申请公布日期 2013.07.11
申请号 US201313748734 申请日期 2013.01.24
申请人 DENSO CORPORATION;DENSO CORPORATION 发明人 SUGIURA KAZUHIKO;FUJII TETSUO;YOKURA HISANORI
分类号 B81C1/00 主分类号 B81C1/00
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