| 摘要 |
<p>The present invention relates to a light microscope, more particularly a differential interference contrast microscope and/or polarization microscope and/or fluorescence microscope, comprising a microscopic beam path for transmitted light and/or reflected light microscopy, in which illumination light can be applied to a sample, more particularly via a condenser, comprising a polarizer arranged in the beam path and serving for polarizing the illumination light, comprising an analyzer arranged in the beam path and serving for analyzing light coming from the sample, and comprising an objective arranged in the beam path and serving for imaging the sample to be arranged in a sample region. The light microscope is characterized in that, for at least partial compensation of depolarization effects brought about by optical components arranged between the polarizer and the analyzer, more particularly by the objective, a compensation device is present in the beam path, said compensation device being arranged between the sample region and the objective in the case of reflected light microscopy and between the condenser and the objective in the case of transmitted light microscopy. The invention additionally relates to an optical module for arrangement in a microscopic beam path of a light microscope.</p> |
