发明名称 TESTING CIRCUIT FOR DC TO DC CONVERTER
摘要 PURPOSE: A test circuit of a dc-dc converter is provided to test the functionality of a DC-DC converter without an inductor or the flow of the large amount of current. CONSTITUTION: Current sources (IVIN, IVID) are respectively connected to power supply voltages (Vs1, Vs2). Current sources (IVO, IVIO) are respectively connected to power supply voltages (Vs4, Vs3). An output capacitor (340), the resistor of the output capacitor (370) and a capacitor (310) transformed from an inductor are connected to the power supply voltage. The switching states of each current source are different. The switching states of a current source (IVIN) are variable. A current source (IVID) and a current source (IVIO) are output dependent current source and the flow direction of current is varied from Vs3 to Vs2.
申请公布号 KR20130078181(A) 申请公布日期 2013.07.10
申请号 KR20110146977 申请日期 2011.12.30
申请人 SILICON WORKS CO., LTD. 发明人 WOO, YOUNG JIN;JEON, IN SUN;KWON, BO MIN
分类号 G01R31/28 主分类号 G01R31/28
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