ION SOURCE FOR MASS SPECTROMETRY

摘要

Systems and methods for delivering a sample to a mass spectrometer are provided. In one aspect, the system can include a sample source for generating a sample plume entrained in a primary gas stream in a first flow direction at a first flow rate, and a gas source for generating a secondary gas stream along a second flow direction different from the first orifice plate flow direction and at a second flow rate greater than the first flow rate. The sample source and the gas source can be positioned relative to one another such that the primary gas stream intersects the secondary gas stream so as to generate a resultant gas stream propagating along a trajectory different from said first and second direction to bring the sample to proximity of a sampling orifice of the mass spectrometer.