发明名称 |
COMPOSITION FOR HARDMASK, METHOD OF FORMING PATTERNS USING THE SAME, AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE INCLUDING THE PATTERNS |
摘要 |
PURPOSE: A composition for forming a hard mask, a pattern forming method using the same, and a semiconductor integrated circuit device including the same are provided to improve optical properties and to obtain high etch resistance. CONSTITUTION: A material layer is formed on a substrate. A hard mask layer is formed on the material layer. A thin film layer with silicon is formed on the hard mask layer. A photoresist layer is formed on the thin film layer with the silicon. A photoresist pattern is formed by exposing and developing the photoresist layer. |
申请公布号 |
KR20130079149(A) |
申请公布日期 |
2013.07.10 |
申请号 |
KR20120131181 |
申请日期 |
2012.11.19 |
申请人 |
CHEIL INDUSTRIES INC. |
发明人 |
LEE, SUNG JAE;MOON, JOON YOUNG;CHO, YOUN JIN;KIM, YOUNG MIN;YOON, YONG WOON |
分类号 |
H01L21/027;G03F7/11;G03F7/26 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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