发明名称 Resistive memory sensing methods and devices
摘要 The present disclosure includes resistive memory sensing methods and devices. One such method includes performing a voltage based multiple pass sensing operation on a group of cells coupled to a selected conductive line of an array of resistive memory cells. The voltage based multiple pass sensing operation can include providing an indication of those cells of the group that conduct at least a threshold amount of current responsive to one of a number of different sense voltages successively applied to the selected conductive line during each of a corresponding number of the multiple passes, and for each successive pass of the multiple passes, disabling data lines corresponding to those cells determined to have conducted the threshold amount of current in association with a previous one of the multiple passes.
申请公布号 US8482955(B2) 申请公布日期 2013.07.09
申请号 US201113035193 申请日期 2011.02.25
申请人 JOHNSON ADAM D.;MICRON TECHNOLOGY, INC. 发明人 JOHNSON ADAM D.
分类号 G11C11/00 主分类号 G11C11/00
代理机构 代理人
主权项
地址