发明名称 High-dielectric constant thin film metal oxides on silicon wafers for capacitor applications and methods of manufacture
摘要 A method of fabrication of high-k paraelectric metal oxide films at low temperatures utilizing ordered mesoporous metal oxide thin films synthesized by organic templating methodology. The process consisting of (a) chemical solution deposition of periodic ordered mesoporous structures containing high-k metal oxide films, (b) removal of organic template additives, (c) infiltration of the pores with an appropriate second phase, and (d) low temperature thermal and/or annealing of infiltrated films.
申请公布号 US8481106(B2) 申请公布日期 2013.07.09
申请号 US20080043309 申请日期 2008.03.06
申请人 MUKHERJEE SHYAMA P.;PHILLIPS MARK L. F.;THOMS TRAVIS P. S.;SBA MATERIALS, INC. 发明人 MUKHERJEE SHYAMA P.;PHILLIPS MARK L. F.;THOMS TRAVIS P. S.
分类号 B05D5/12;B05D3/00;C23C14/02;H01G7/00 主分类号 B05D5/12
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